asylum research afm manual

Silicon probe with no reflex coating for force modulation mode. f = 1200 kHz   |   k = 18 N/m   |   tip coating: none. Fast scanning probe with full carbon tip; for ultrafast high resolution bioimaging. f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoPt/FePt. tip radius = 20 - 2000 nm   |   k = 0.2 - 2000 N/m   |   tip coating: none. Also known as OLTESPA; medium soft cantilever for topgraphy and viscoelasticity of soft samples. Press Release: New “Relate” Software for Correlative Imaging with Atomic…, Oxford Instruments Asylum Research Releases a New Application Note: Introducing…, The AFM for Mechanobiology Webinar is an insightful overview of atomic…, The "Nanotribology with the AFM" application note describes the latest…, Plasma Technology, NanoScience, Andor, NanoAnalysis, Asylum Research, By submitting this form I agree that Oxford Instruments will process my data in the manner described in the, Measuring Nanomechanical and Thermal Properties, Measuring Nanoelectrical and Electrochemical Properties, Controlling Temperature and Gas Environment, Subjecting Samples to Other Driving Forces, Relate: software for correlative imaging with AFM, EM, EDS, and EBSD, Solar, Photovoltaics, and Thermoelectrics, Development of Custom AFM Instrumentation, Measurement of Chemical and Molecular Composition, Solar Cell Electrical and Structural Characterisation, Measurement of Polymer and Polymer Phase Properties, Imaging of Layered Polymer Structures and Failure Analysis, Characterisation of Low Dimensional Structures, Fabrication and Characterisation of Light Emitting Devices, Fast scanning with results in seconds instead of minutes, Every step of operation is simpler for remarkable productivity, Small footprint in the lab, huge potential to grow in capability, Support that goes above and beyond your expectations, Unmatched mechanical stability—noise floor, Exceptionally low drift—higher resolution and straight lattice lines, Low noise electronics—no artifacts from electronic noise sources, Supports the fastest, smallest probes (3×9 µm spot size—optional), Fast scanning that goes beyond topography—also nanomechanics, CAFM, PFM, Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus), Unmatched range of nanoelectrical and electromechanical characterization modes, Upgradeable to the Cypher ES for environmental control accessories and to Cypher VRS for video-rate imaging, Many standard operating modes and even more optional modes, Includes a standard one-year comprehensive warranty, No-charge technical support and basic applications support for life, Affordable support agreements that offer extended warranties and advanced training. Silicon probe with visible tip apex and magnetic coating for high coercivity MFM applications. Force modulation with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime. Read full article > View all news. Nitride probe with shielded co-axial sensor specialized for sMIM applications.

New Relate Software. The Cypher S is a great AFM for both materials science and life science research for ambient measurements in both air and liquids. Supersharp EBID carbon AFM probe with 2 nm tip radius on soft 0.4 N/m cantilever. EBD-TESPA: Diamond-like carbon probe with unrivaled lifetime. More than just an extended warranty, these packages provide peace of mind that your AFM is operating at peak performance and offer training opportunities for users. Accessories for subjecting your sample to other driving forces like magnetic fields, mechanical strain, high voltage fields, and more. Silicon probe with visible tip apex and magnetic coating for low moment MFM applications. North America South America Canada Australia, Address:6310 Hollister Ave Santa Barbara, California 93117, Working Days/Hours:Mon - Fri / 8:00AM - 5:00PM PST.
Soft (cells, hydrogels) (77) Medium (polymers, rubbers) (98) Hard (metals, …

f = 70 kHz   |   k = 2 N/m   |   tip coating: none.

CoNi side-coated tip silicon probe for high resolution MFM. It’s like a manual, but more brief and to the point regarding procedures. f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none.

The MFP-3D Infinity will make your routine imaging tasks even easier and faster to complete while also supporting your most ambitious projects.

f = 330 kHz   |   k = 42 N/m   |   tip coating: none. f = 160 kHz   |   k = 7.4 N/m   |   tip coating: none.

Accessories for operation in controlled liquid environments, with or without perfusion. f = 1500 kHz   |   k = 0.1 N/m   |   tip coating: none. Silicon probe with Al reflex coating for soft tapping mode. Silicon probe with visible tip apex and magnetic coating for low coercivity MFM applications. Silicon probe with sharp tip for high resolution imaging in force modulation mode. Also includes PFM, STM, and EC-AFM techniques, Additional options to make the MFP-3D work for you. f = 65 kHz   |   k = 2.8 N/m   |   tip coating: diamond tip. Quartz like probe with more stability for soft contact mode. Also known as OSCM; conductive probe with visible apex tip for electrical measurement.

The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. Sample Type . We use cookies to ensure that we give you the best experience on our website. Silicon probe with Al reflective coating for tapping/non contact mode. Silicon probe with visible tip apex and magnetic coating for high moment MFM applications. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and accessories.

Oxford Instruments Asylum Research Jupiter XR Large-Sample AFM Now Includes New Ergo Software Interface for Even Greater Productivity. The Cypher S is fully upgradable later for environmental control options or even video-rate scanning.

AFM Tips, AFM Probes and AFM Cantilevers for Atomic Force Microscopy Asylum Research an Oxford Instruments Company ... Asylum Research (12) Olympus (11) Nanosensors (98) Nanoworld (59) Primenano (2) Rocky Mountain (6) SmartTip (5) Nanotools (9) Adama Innovations (7) Show Less Show More. Silicon probe with Al reflective coating for soft tapping mode. Cypher AFMs have also earned a reputation for easily achieving higher resolution than other AFMs. Silicon probe coated with high moment material for MFM.

Ergo makes it simpler and faster to acquire high-quality AFM images. f = 11 kHz   |   k = 0.01 N/m   |   tip coating: none. Press Release: New “Relate” Software for Correlative Imaging with Atomic Force Microscopy and Electron Microscopy.

More than just an extended warranty, these packages provide peace of mind that your AFM is operating at peak performance and offer training opportunities for users. French SPM Days 2020. f = 50 kHz   |   k = 0.1 N/m   |   tip coating: none. Add to quote list Also known as OTESPA; silicon probe with visible apex tip for tapping mode. Asylum Research is a manufacturer of the MFP-3D Infinity™ high performance AFM. f = 110 kHz   |   k = 0.09 N/m   |   tip coating: none.

Accessories for controlling temperature, the gas environments (gas/vapor composition or humidity), and operating under ultra-low oxygen and/or water levels in a glovebox. Silicon probe with visible tip apex and Au reflex coating for high speed imaging. Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.

Quartz like probe with three cantilevers for contact mode. Sharp conductive probe with PtSi coating for electrical measurements. Ergo is the all-new Asylum AFM software, which complements our Igor Pro-based software. Contents

Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements, f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Ti/Ir. Request Pricing 200 nm long carbon tip with 2 nm radius on soft qp-BioAC probe; Designed for gentle, high resolution bioimaging. f = 70 kHz   |   k = 2 N/m   |   tip coating: Ti/Pt. 15 um long carbon tip with 25 nm radius on soft qp-BioAC cantilever; For enhanced accessibility to subjacent regions of tall biosamples. Press Release: New “Relate” Software for Correlative Imaging with Atomic…, Oxford Instruments Asylum Research Releases a New Application Note: Introducing…, The AFM for Mechanobiology Webinar is an insightful overview of atomic…, The "Nanotribology with the AFM" application note describes the latest…, Plasma Technology, NanoScience, Andor, NanoAnalysis, Asylum Research, By submitting this form I agree that Oxford Instruments will process my data in the manner described in the, 33% lower than any other large-sample AFM, Measuring Nanomechanical and Thermal Properties, Measuring Nanoelectrical and Electrochemical Properties, Controlling Temperature and Gas Environment, Subjecting Samples to Other Driving Forces, Relate: software for correlative imaging with AFM, EM, EDS, and EBSD, Solar, Photovoltaics, and Thermoelectrics, Development of Custom AFM Instrumentation, Measurement of Chemical and Molecular Composition, Solar Cell Electrical and Structural Characterisation, Measurement of Polymer and Polymer Phase Properties, Imaging of Layered Polymer Structures and Failure Analysis, Characterisation of Low Dimensional Structures, Fabrication and Characterisation of Light Emitting Devices, In-Situ Observation of Chemical Reactions, Widest range of options and modes to turn your ideas into results, Simple to use without sacrificing flexibility, Support that our users routinely cite as best in the industry, Superior mechanical stability—Noise floor is, Low noise, high stability position sensors, Robust construction, dependable performance that thrives in busy labs, Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus), Unmatched range of nanoelectrical and electromechanical characterization modes, Numerous environmental accessories for temperature control, Controlled gas or liquid environment options that are simple, safe, and effective, Unique accessories for applying external forces to a wide range of samples, Includes a standard one-year comprehensive warranty, No-charge technical support and basic applications support for life, Affordable support agreements that offer extended warranties and advanced training.
Each technique requires a separate training. f = 19 kHz   |   k = 1 N/m   |   tip coating: TiW/Au.

The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and accessories. Silicon probe with high aspect ratio (>10) tip for deep trench imaging. The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. Accessories for operation in controlled liquid environments, with or without perfusion and for heating while operating in liquids.

Asylum Research offers a full suite of tools for characterizing electrical properties at the nanoscale on the MFP-3D™ and Cypher™ families of atomic force microscopes. f = 300 kHz   |   k = 26 N/m   |   tip coating: none. f = 285 kHz   |   k = 42 N/m   |   tip coating: Ti/Ir, f = 300 kHz   |   k = 42 N/m   |   tip coating: Ti/Ir. JavaScript seems to be disabled in your browser.

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